Can CNN detect cracks in solar PV modules?

In recent years, CNN has emerged as a powerful tool in crack detection, enhancing the accuracy and efficiency of PV module inspection [ 6 ]. These deep learning algorithms have demonstrated their effectiveness in detecting and classifying cracks in solar PV modules, enabling timely and effective maintenance and repair.

Can a pre-trained network detect cracks in solar panels?

Accuracy of pre-trained networks and ensemble learning for monocrystalline and polycrystalline solar panels [ 68 ]. According to another study [ 69 ], a hybrid method involving a CNN pre-trained network of VGG-16 and support vector machines (SVM) has been proposed as an effective method of detecting cracks in PV panels.

How to detect small cracks in PV modules?

Detecting small cracks in PV modules is a challenging task. These cracks can occur during production, installation and operation stages. Electroluminescence (EL) imaging test procedure is often used to detect these cracks. Defective images with linear and star cracks obtained from EL are collected.

Can deep learning detect cracks in solar PV modules?

These deep learning algorithms have demonstrated their effectiveness in detecting and classifying cracks in solar PV modules, enabling timely and effective maintenance and repair. An overview of the CNN flowchart for detecting cracks in PV is shown in Figure 1.

What is solar cell micro crack detection technique?

Solar cell micro crack detection technique is proposed. Conventional Electroluminescence (EL) is used to inspect the solar cell cracks. The techniques is based on a Binary and Discreet Fourier Transform (DFT) image processing models. Maximum detection and image refinement speed of 2.52s has been obtained.

Why do we need multiple crack-free and cracked solar cell samples?

Multiple crack-free and cracked solar cell samples are required to for the training purposes. The technique uses the analysis of the fill-factor and solar cell open circuit voltage for improving the detection quality of PL and EL images. The technique needs further inspection of the solar cell main electrical parameters.