What are the visual standards for chip capacitors?

After describing high reliability testing in our previous article, let’s discuss visual standards for chip capacitors. Multilayer ceramic capacitors (MLCCs) must possess fine workmanship and physical integrity, so visual inspection of the product is performed at 20X magnification to check for defects in the capacitor body and end metallization.

What are the quality standards for chip capacitors?

In addition to the external visual characteristics, quality standards for internal microstructure of the chip capacitor are also applicable, as viewed on polished cross sections of capacitor samples. Units are sectioned along the long and short dimension of the capacitor to provide two edge views of the internal electrodes and terminals.

What is considered a defect in a capacitor?

Any void which can be considered detrimental to the electrical and physical integrity of the capacitor is classified as a defect, and generally involves the following: Any crack which can be considered detrimental to the electrical and physical integrity of the capacitor is classified as a defect, and generally involves the following:

Do irregularities in the construction of a chip capacitor affect electrical integrity?

Irregularities in the construction of the chip capacitor do not necessarily affect the mechanical or electrical integrity of the device, but may be of concern in high reliability applications. The following is a compilation of structural irregularities according to the EIA 469: Figure 2. Microstructure defects

What is capacitor fundamentals?

Welcome to the Capacitor Fundamentals Series, where we teach you about the ins and outs of chips capacitors – their properties, product classifications, test standards, and use cases – in order to help you make informed decisions about the right capacitors for your specific applications.

Why are capacitors sectioned along a long and short dimension?

Units are sectioned along the long and short dimension of the capacitor to provide two edge views of the internal electrodes and terminals. Although any degree of internal defect is considered undesirable, the fact remains that these types of defects can occur occasionally in different degrees of severity.